Miller D.J., Rupich M., Welp U., Fleshler S., Civale L., Ghigo G., Laviano F., Kwok W.K., Kayani A., Leroux M., Eley S., Kihlstrom K.J., Niraula P.
Miller D.J., Rupich M.W., Welp U., Civale L., Kwok W., Kayani A., Leroux M., Eley S., Niraula P.M., Sheng H.
Rupich M.W., Sathyamurthy S., Fleshler S., Li Q., Solovyov V., Ozaki T., Welp U., Kwok W., Leroux M., Koshelev A.E., Miller D.J., Kihlstrom K., Civale L., Eley S., Kayani A.
Miller D.J., Rupich M.W., Welp U., Fleshler S., Sathyamurthy S., Civale L., Kayani A., Leroux M., Eley S., Niraula P.M., Kwok W.-K., Kihlstrom K.J., Holleis S., Sheng H.P.
Miller D.J., Rupich M.W., Li X., Malozemoff A.P., Welp U., Fleshler S., Sathyamurthy S., Civale L., Kwok W.K., Jia Y., Kayani A., Leroux M., Wen J.G., Ayala-Valenzuela O.
Miller D.J., Zhang Y., Selvamanickam V., Chen Y., Majkic G., Guevara A., Shi T., Yao Y., Lei C., Galtsyan E.
Ключевые слова: HTS, YBCO, doping effect, REBCO, coated conductors, composition, microstructure, pinning, critical caracteristics, angular dependence, critical current, experimental results
Miller D.J., Maroni V.A., Specht E.D., Chen Z., Aytug T., Paranthaman M.P., Zuev Y., Kropf A.J., Zaluzec N.J.
Miller D.J., Maroni V.A., Specht E.D., Paranthaman M., Aytug T., Cantoni C., Zhang Y., Zuev Y., Kropf A.J., Chen Z.*21, Zaluzec N.
Ключевые слова: HTS, YBCO, REBCO, coated conductors, RABITS process, TFA-MOD process, fabrication, Raman spectroscopy, phase formation, thickness dependence, time evolution
Miller D.J., Maroni V.A., Rupich M.W., Li X., Specht E.D., Christen D.K., Larbalestier D.C., Sathyamurthy S., Thompson J.R., Feenstra R., Xu A., Sinclair J.
Miller D.J., Maroni V.A., Li X., Rupich M., Chen Z., Sathyamurthy S., Feenstra R., Zaluzec N.J., Cooley K.
Miller D.J., Maroni V.A., Li X., Zhang W., Kodenkandath T., Chen Z., Holesinger T.G., Larbalestier D.C., Feenstra R., Coulter J.Y., Civale L., Maiorov B., Feldmann D.M., Huang Y.
Ключевые слова: HTS, YBCO, coated conductors, nanoscaled effects, microstructure, chemical solution deposition, fabrication, nucleation, porosity, critical current, n-value, homogeneity, thickness dependence, pinning force, MOD process, critical current density, angular dependence, RABITS process, PLD process, Jc/B curves, critical caracteristics
Ключевые слова: HTS, YBCO, coated conductors, fluorine process, fabrication, phase formation, Raman spectroscopy, measurement technique
Zhang W., Huang Y., Li X., Kodenkandath T., Rupich M.W., Schoop U., Verebelyi D.T., Thieme C.L., Siegal E., Holesinger T.G., Maiorov B., Civale L., Miller D.J., Maroni V.A., Li J., Martin P.M., Specht E.D., Goyal A., Paranthaman M.P.
Miller D.J., Maroni V.A., Rupich M.W., Li X., Kodenkandath T., Holesinger T.G., Civale L., Maiorov B., Huang Y., Arenal R.
Ключевые слова: HTS, coated conductors, long conductors, MOD process, microstructure, defects, YBCO, MOD process, fabrication, pinning, presentation, measurement technique
Balachandran U.(balu@anl.gov), Miller D.J., Maroni V.A., Vlasko-Vlasov V., Welp U., Gray K.E., Reeves J., Claus H., Trasobares S., Lei Y., Hiller J.M.
Ma B., Koritala R.E., Fisher B.L., Dorris S.E., Miller D.J., Balachandran U., Maroni V.A., Uprety K.K.
Ключевые слова: HTS, coated conductors, buffer layers, ISD process, surface, microstructure, substrate Hastelloy, PLD process, thickness dependence, angular dependence, fabrication
Miller D.J., Maroni V.A., Rupich M.W., Li X., Zhang W., Kodenkandath T., Gray K.E., Reeves J., Vlasko-Vlasov V.K., Claus H., Trasobares S., Lei Y., Hiller J.M., Venkataraman K.(venkataraman@wisc.edu)
Koritala R.E., Fisher B.L., Baurceanu R., Dorris S.E., Miller D.J., Balachandran U., Berghuis P., Gray K.E., Ma B.(bma@anl.gov), Uprety K.K.
Li M., Ma B., Koritala R.E., Fisher B.L., Markowitz A.R., Erck R.A., Baurceanu R., Dorris S.E., Miller D.J., Balachandran U.
Ключевые слова: HTS, YBCO, coated conductors, substrate Hastelloy, ISD process, PLD process, template layers, fabrication, magnetic properties
Li M., Ma B., Koritala R.E., Fisher B.L., Balachandran U.(balu@anl.gov), Dorris S.E., Miller D.J.
Ключевые слова: HTS, YBCO, coated conductors, substrate Hastelloy, ISD process, PLD process, microstructure, experimental results, fabrication, magnetic properties
Fisher B.L., Miller D.J., Balachandran U., Koritala R.E.(koritala@anl.gov), Beihai M., Meiya L.
Ключевые слова: HTS, YBCO, coated conductors, template layers, buffer layers, ISD process, microstructure, fabrication, substrate Ni-V
Koritala R.E., Fisher B.L., Markowitz A.R., Erck R.A., Dorris S.E., Miller D.J., Balachandran U., Meiya L., Beihai M.(bma@anl.gov)
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